JIS K 0149-1:2019
Current
Current
The latest, up-to-date edition.
Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Available format(s)
Hardcopy
Language(s)
Japanese
Published date
20-11-2019
Publisher
| DocumentType |
Revision
|
| Pages |
18
|
| ProductNote |
This standard also refers to Q17034.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Supersedes |
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