JIS K 0149-1:2019
Current
Current
The latest, up-to-date edition.
Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Available format(s)
Hardcopy
Language(s)
Japanese
Published date
20-11-2019
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| DocumentType |
Revision
|
| Pages |
18
|
| ProductNote |
This standard also refers to Q17034.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| ISO 16700:2016 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.