JIS Z 9015:1980
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Sampling Inspection Procedures And Tables By Attributes With Severity Adjustment (receiving Inspection Where A Consumer Can Select Suppliers)
Hardcopy
20-05-1999
JIS Z 9015-1:2006
JIS Z 9015-3:1999
JIS Z 9015-3:2011
JIS Z 9015-2:1999
JIS Z 9015-0:1999
English
15-02-2008
1. Scope2. Definitions and Symbols 2.1 Definitions 2.2 Symbols3. Inspection Procedure4. Operation of Inspection 4.1 Establishment of Quality Criteria 4.2 Classification of Defects or Defectives 4.3 Designation of AQL 4.4 Designation of Inspection Level 4.5 Selection of Type of Inspection 4.6 Designation of Inspection Severity 4.7 Formation of Lot 4.8 Selection of Sampling Inspection Plans 4.8.1. Sample Size Code Letters 4.8.2. Case of Single Sampling Inspection 4.8.3. Case of Double Sampling Inspection 4.8.4. Case of Multiple Sampling Inspection Plan 4.9 Taking Sample 4.10 Test of Sample 4.11 Determination of Lot Acceptability 4.11.1 Classes of Defects or Defectives and Determination of Acceptability 4.11.2 Case of Single Sampling Inspection for Percent Defective 4.11.3 Case of Double Sampling Inspection for Percent Defective 4.11.4 Case of Multiple Sampling Inspection for Percent Defective 4.11.5 Case of Sampling Inspection for Defects per One Hundred Units 4.11.6 Special Procedure 4.12 Disposition of Lot 4.13 Resubmitting Rejected Lot 4.14 Special Measures for Critical Defects5. Adjustment of Inspection Severity 5.1 General Items 5.1.1 Necessity for Adjusting Severity of Inspection 5.1.2 Adjustment for Severity for Classes of Defects or defective 5.1.3 Time of Adjusting Severity 5.1.4. Exclusion of Resubmitted Lot 5.2 First Inspection and subsequent Inspection 5.2.1 First Inspection 5.5.2 Subsequent Inspection 5.3 Switching Procedures 5.3.1 Change from Normal Inspection to Tightened Inspection 5.3.2 Change from Tightened Inspection to Normal Inspection 5.3.3 Change from Normal Inspection to Reduced Inspection 5.3.4 Change from Reduced Inspection to Normal Inspection 5.4 Discontinuation of InspectionAttached Table 1 Sample Size Code LettersAttached Table 2-A Single Sampling Plans for Normal Inspection (Master Table)Attached Table 2-B Single Inspection Plans for Tightened Inspection (Master Table)Attached Table 2-C Single Inspection Plans for Reduced Inspection (Master Table)Attached Table 3-A Double Sampling Plans for Normal Inspection (Master Table)Attached Table 3-B Double Sampling Plans for Tightened Inspection (Master Table)Attached Table 3-C Double Sampling Plans for Reduced Inspection (Master Table)Attached Table 4-A Multiple Sampling Plans for Normal Inspection (Master Table)Attached Table 4-B Multiple Sampling Plans for Tightened Inspection (Master Table)Attached Table 4-C Multiple Sampling Plans for Reduced Inspection (Master Table)Attached Table 5-A Limit Numbers for Tightened InspectionAttached Table 5-B Limit Numbers for Reduced InspectionAttached Fig. 1-A OC Curves for Normal InspectionAttached Fig. 1-B OC Curves for Normal InspectionAttached Fig. 1-C OC Curves for Normal InspectionAttached Fig. 2-A OC Curves for Tightened InspectionAttached Fig. 2-B OC Curves for Tightened InspectionAttached Fig. 2-C OC Curves for Tightened InspectionAttached Fig. 3-A OC Curves for Reduced InspectionAttached Fig. 3-B OC Curves for Reduced InspectionAttached Fig. 3-C OC Curves for Reduced InspectionAttached Fig. 3-D OC Curves for Reduced InspectionAttached Fig. 3-E OC Curves for Reduced Inspection
Defines the methods of determining and operating single, double,and multiple sampling inspection plans by attributes expressed in terms of the number of defectives or defects with severity adjustment. This also applies in the case where a series of lots is submitted successively to receiving inspection and suppliers can be selected.
DocumentType |
Standard
|
Pages |
0
|
PublisherName |
Japanese Standards Association
|
Status |
Withdrawn
|
SupersededBy |
80
JIS C 5201-4-1:1998 | Fixed resistors for use in electronic equipment. Part 4: Blank detail specification: Fixed power resistors. Assessment level E |
JIS C 5101-13-1:1999 | Fixed capacitors for use in electronic equipment Part 13: Blank detail specification: Fixed polypropylene film dielectric metal foil d.c. capacitors Assessment level E |
JIS C 5443:1997 | Generic specification of switches for use in electronic equipment |
JIS C 5101-9:1998 | Fixed capacitors for use in electronic equipment. Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, class 2 |
JIS C 5260-1:1999 | Potentiometers for use in electronic equipment Part 1: Generic specification |
JIS C 5101-15:1998 | Fixed capacitors for use in electronic equipment. Part 15: Sectional specification: Fixed tantalum capacitors with non-solid or solid electrolyte |
JIS C 5101-15-1:1998 | Fixed capacitors for use in electronic equipment. Part 15: Blank detail specification: Fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E |
JIS C 5101-3-1:1998 | Fixed capacitors for use in electronic equipment. Part 3: Blank detail specification: Fixed tantalum chip capacitors. Assessment level E |
JIS C 5101-14-1:1998 | Fixed capacitors for use in electronic equipment. Part 14: Blank detail specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains. Assessment level D |
JIS C 5201-5-1:1998 | Fixed resistors for use in electronic equipment. Part 5: Blank detail specification: Fixed precision resistors. Assessment level E |
JIS C 5201-6:1999 | Fixed resistors for use in electronic equipment Part 6: Sectional specification: Fixed resistor networks with individually measurable resistors |
JIS C 5201-4-2:1998 | Fixed resistors for use in electronic equipment. Part 4: Blank detail specification: Fixed power resistors. Assessment level F |
JIS C 5201-6-1:1999 | Fixed resistors for use in electronic equipment Part 6: Blank detail specification: Fixed resistor networks with individually measurable resistors, all of equal value and equal dissipation Assessment level E |
JIS C 5201-8-1:1998 | Fixed resistors for use in electronic equipment. Part 8: Blank detail specification: Fixed chip resistors. Assessment level E |
JIS C 5101-15-2:1998 | Fixed capacitors for use in electronic equipment Part 15: Blank detail specification: Fixed tantalum capacitors with non-solid electrolyte and porous anode Assessment level E Part 15: Blank detail specification: Fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E |
JIS C 5101-16-1:1999 | Fixed capacitors for use in electronic equipment Part 16: Blank detail specification: Fixed metallized polypropylene film dielectric d.c. capacitors Assessment level E |
JIS C 5101-10-1:1999 | Fixed capacitors for use in electronic equipment Part 10: Blank detail specification: Fixed multilayer ceramic chip capacitors Assessment level E |
JIS C 5101-8-1:1998 | Fixed capacitors for use in electronic equipment. Part 8: Blank detail specification: Fixed capacitors of ceramic dielectric, class 1. Assessment level E |
JIS C 5420:1991 | General rules of one-part connectors for printed wiring board |
JIS C 5101-2-1:1998 | Fixed capacitors for use in electronic equipment. Part 2: Blank detail specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors. Assessment level E |
JIS R 3414:2006 | Textile Glass Fabrics |
JIS C 5101-15-3:1998 | Fixed capacitors for use in electronic equipment. Part 15: Blank detail specification: Fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E |
JIS C 5700:1974 | General rules for reliability assured electronic components |
JIS C 5101-4-2:1998 | Fixed capacitors for use in electronic equipment Part 4: Blank detail specification: Aluminium electrolytic capacitors with solid electrolyte Assessment level E |
JIS C 6421:1994 | Intermediate frequency transformers for broadcast receiver |
JIS E 1107:1998 | Steel bolts and nuts for fish-plates and fastenings |
JIS C 5201-2-1:1998 | Fixed resistors for use in electronic equipment Part 2: Blank detail specification: Fixed low-power non-wirewound resistors Assessment level E Part 2: Blank detail specification: Fixed low-power non-wirewound resistors. Assessment level E |
JIS T 9115:2000 | Single-use Rubber Examination Gloves |
JIS C 6444:1991 | Variable carbon composition resistors for use in electronic equipment - Characteristics Y, W and UC |
JIS C 5201-1:1998 | Fixed resistors for use in electronic equipment Part 1: Generic specification |
JIS C 6439:1995 | Fixed mica capacitors for use in electronic equipment |
JIS C 5201-6-2:1999 | Fixed resistors for use in electronic equipment Part 6: Blank detail specification: Fixed resistor networks with individually measurable resistors, of either different resistance values or different rated dissipations Assessment level E |
JIS C 5401:1991 | General rules of connectors for use in electronic equipment |
JIS R 3411:2006 | Textile Glass Chopped Strand Mats |
JIS C 5101-18-2:1999 | Fixed capacitors for use in electronic equipment Part 18: Blank detail specification: Fixed aluminium electrolytic chip capacitors with non-solid electrolyte Assessment level E |
JIS T 9116:2000 | Single-use Polyvinyl Chloride Examination Gloves |
JIS C 5101-11-1:1998 | Fixed capacitors for use in electronic equipment. Part 11: Blank detail specification: Fixed polythylene-terephthalate film dielectric metal foil d.c. capacitors. Assessment level E |
JIS R 3413:2006 | Textile Glass Yarns |
JIS C 6401:1991 | Fixed wire wound resistors - Power type |
JIS C 5101-4-1:1998 | Fixed capacitors for use in electronic equipment. Part 4: Blank detail specification: Aluminium electrolytic capacitors with non-solid electrolyte. Assessment level E |
JIS R 3421:2006 | Textile Finished Glass Fabrics For Bag Filter |
JIS C 5101-3:1998 | Fixed capacitors for use in electronic equipment. Part 3: Sectional specification: Fixed tantalum chip capacitors |
JIS C 5101-9-1:1998 | Fixed capacitors for use in electronic equipment -- Part 9-1: Blank detail specification: Fixed capacitors of ceramic dielectric, Class 2 Assessment level EZ Part 9: Blank detail specification: Fixed capacitors of ceramic dielectric, class 2. Assessment level E |
JIS C 5260:1996 | General rules of potentiometers for use in electronic equipment |
JIS C 5201-2-2:1998 | Fixed resistors for use in electronic equipment. Part 2: Blank detail specification: Fixed low-power non-wirewound resistors. Assessment level F |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.