MIL C 49464 : A

Superseded

Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

CAPACITORS, CHIP, SINGLE LAYER, FIXED, PARALLEL PLATE, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY

Available format(s): PDF

Superseded date: 03-06-2004

Language(s):

Published date:

Abstract - (Show below) - (Hide below)

Covers capacitors intended for stripline or microstrip applications, usually at frequencies of 1GHz and higher.

Committee	FSC 5910
Development Note	A Notice 2 - Notice of Reinstatement (12/2001)
Document Type	Standard
ISBN
Pages
Published
Publisher	US Military Specs/Standards/Handbooks
Status	Superseded
Superseded By	MIL-PRF-49464 Revision C:2009

MIL C 39028 : C	CAPACITORS, PACKAGING OF
MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
MIL-STD-810 Revision G:2008	ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS
EIA 554 : 1996	METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM)
MIL C 49464/1 : A	CAPACITORS, CHIP, SINGLE LAYER, FIXED UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, STYLE CPCR01 (HIGH FREQUENCY)
MIL-STD-790 Revision G:2011	ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS
QQ-S-571 Revision F:1994	SOLDER, ELECTRONIC (96 TO 485 DEGREES C)
MIL-STD-202 Revision H:2015	ELECTRONIC AND ELECTRICAL COMPONENT PARTS
EIA 557 : 2006	STATISTICAL PROCESS CONTROL SYSTEMS
MIL-STD-690 Revision D:2005	Failure Rate (FR) Sampling Plans and Procedures

Product Format

Quantity

Buy now

Add to cart

Create account

Covers capacitors intended for stripline or microstrip applications, usually at frequencies of 1GHz and higher.

Committee	FSC 5910
Development Note	A Notice 2 - Notice of Reinstatement (12/2001)
Document Type	Standard
ISBN
Pages
Published
Publisher	US Military Specs/Standards/Handbooks
Status	Superseded
Superseded By	MIL-PRF-49464 Revision C:2009

MIL C 39028 : C	CAPACITORS, PACKAGING OF
MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
MIL-STD-810 Revision G:2008	ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS
EIA 554 : 1996	METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM)
MIL C 49464/1 : A	CAPACITORS, CHIP, SINGLE LAYER, FIXED UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, STYLE CPCR01 (HIGH FREQUENCY)
MIL-STD-790 Revision G:2011	ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS
QQ-S-571 Revision F:1994	SOLDER, ELECTRONIC (96 TO 485 DEGREES C)
MIL-STD-202 Revision H:2015	ELECTRONIC AND ELECTRICAL COMPONENT PARTS
EIA 557 : 2006	STATISTICAL PROCESS CONTROL SYSTEMS
MIL-STD-690 Revision D:2005	Failure Rate (FR) Sampling Plans and Procedures