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MIL-HDBK-817 Base Document:1994

Current

Current

The latest, up-to-date edition.

SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE

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1. SCOPE
   1.1 Background
   1.2 Document application
   1.3 Relationship to MIL-HDBK-814, MIL-HDBK-815, and
        MIL-HDBK-816
   1.4 Document objectives
2. APPLICABLE DOCUMENTS
   2.1 Documents for hardness assurance programs
   2.2 Military standard test methods
   2.3 ASTM dosimetry standards
   2.4 ASTM electrical measurement and radiation test
        standards
   2.5 Important documents: special attention
   2.6 Device data bases
3. DEFINITIONS
   3.1 Key definitions
   3.2 Commonly used terms
   3.3 Acronyms
4. GENERAL REQUIREMENTS
   4.1 The hardness assurance program
   4.2 Features of HA programs
5. DETAILED REQUIREMENTS
   5.1 HA program definition
   5.2 System development background: hostile threats
   5.3 Life cycle survivability and hardness approach
   5.4 HA program in life cycle survivability
   5.5 Program management: documentation of roles
   5.6 Government project manager (or SPO) HA activities
   5.7 Contractor HA activities
   5.8 Program development: HA through engineering and
        manufacturing development (EMD)
   5.9 HA during production
   5.10 Other hardness assurance considerations statistical
   5.11 Summary
6. REFERENCES
FIGURES
TABLES

Gives guidance in defining HA activities commensurate with the threat nuclear weapon and space radiation environment and with the concept of balanced hardening to all hostile environments. These guidelines are aimed primarily at system development agencies, project managers and their contractors.

Committee
FSC 59GP
DevelopmentNote
NOTICE 1 - Notice of Validation. (02/2015) NEW CHILD NOT 2 2021 IS NOW ADDED.
DocumentType
Standard
Pages
56
ProductNote
NEW CHILD NOT 2 2021 IS NOW ADDED.
PublisherName
US Military Specs/Standards/Handbooks
Status
Current

MIL-STD-1546 Revision B:1992 PARTS, MATERIALS, AND PROCESSES CONTROL PROGRAM FOR SPACE AND LAUNCH VEHICLES
ASTM F 1191 : 1988 Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)
ASTM F 632 : 1990 Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
MIL-HDBK-814 Base Document:1994 IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES
ASTM E 845 : 1981 Method for Calibration of Dosimeters Against an Adiabatic Calorimeter for Use in Flash X-Ray Fields (Withdrawn 1987)
ASTM E 665 : 1994 Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)
MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
ASTM E 720 : 2016 : REDLINE Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
ASTM E 763 : 1991 Practice for Calculation of Absorbed Dose From Neutron Irradiation by Application of Threshold-Foil Measurement Data (Withdrawn 1997)
ASTM F 980 : 2016 : REDLINE Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
MIL-STD-480 Revision B:1988 CONFIGURATION CONTROL - ENGINEERING CHANGES, DEVIATIONS AND WAIVERS
ASTM F 617 : 2000 Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)
ASTM E 1205 : 2009 PRACTICE FOR USE OF A CERIC-CEROUS SULFATE DOSIMETRY SYSTEM
MIL-STD-1547 Revision B:1992 ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES
DOD STD 100 : C NOTICE 6 ENGINEERING DRAWING PRACTICES
MIL-STD-1809 Base Document:1991 SPACE ENVIRONMENT FOR USAF SPACE VEHICLES
ASTM F 526 : 2016 : REDLINE Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
ASTM E 265 : 2015 : REDLINE Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
ASTM F 618 : 1979 Method for Measuring MOSFET Saturated Threshold Voltage
MIL-HDBK-279 Base Document:1985 TOTAL DOSE HARDNESS ASSURANCE GUIDELINE FOR SEMICONDUCTOR DEVICE & MICROCIRCUIT
DI-NUOR-80156 Revision B:2013 Nuclear Survivability Program Plan
ASTM F 675 : 1991 Test Method for Measuring Nonequilibrium Transient Photocurrents in P-N Junctions (Withdrawn 1995)
DOD STD 1766 : A NUCLEAR HARDNESS AND SURVIVABILITY PROGRAM REQUIREMENTS FOR ICBM WEAPON SYSTEMS
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
ASTM E 1026 : 2015 : REDLINE Standard Practice for Using the Fricke Dosimetry System
ASTM F 774 : 1982 Guide for Analysis of Latchup Susceptibility in Bipolar Integrated Circuits (Withdrawn 1987)
ASTM E 1027 : 1992 Practice for Exposure of Polymeric Materials to Ionizing Radiation (Withdrawn 1996)
ASTM E 721 : 2016 : REDLINE Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
MIL-STD-414 Base Document:1957 SAMPLING PROCEDURE AND TABLE FOR INSPECTION BY VARIABLES FOR PERCENT DEFECTIVE
ASTM E 722 : 2014 : REDLINE Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM E 668 : 2013 : REDLINE Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
DI-NUOR-80926 Revision A:2013 Nuclear Survivability Assurance Plan
MIL-HDBK-816 Base Document:1994 Guidelines for Developing Radiation Hardness Assurance Device Specifications
ASTM F 570 : 1990 Test Method for Transistor Collector-Emitter Saturation Voltage (Withdrawn 1995)
ASTM E 1249 : 2015 : REDLINE Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
MIL-STD-339 Base Document:1987 WIRING AND WIRING DEVICES FOR COMBAT AND TACTICAL VEHICLES, SELECTION AND INSTALLATION OF
ASTM F 1032 : 1991 Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
DI-NUOR-80928 Revision A:2013 Nuclear Survivability Test Plan
ASTM E 1250 : 2015 : REDLINE Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
MIL-HDBK-780 Revision D:2004 STANDARD MICROCIRCUIT DRAWINGS
ASTM F 1096 : 1987 Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992)
DI-ENVR-80266 Revision A:2016 NUCLEAR HARDNESS AND SURVIVABILITY (NH&S) DESIGN ANALYSIS REPORT
MIL-HDBK-815 Base Document:1994 DOSE-RATE HARDNESS ASSURANCE GUIDELINES
ASTM F 1467 : 2011-10 GUIDE FOR USE OF AN X-RAY TESTER ([APPROXIMATE] 10 KEV PHOTONS) IN IONIZING RADIATION EFFECTS TESTING OF SEMICONDUCTOR DEVICES AND MICROCIRCUITS
DI-NUOR-80927 Revision A:2013 Nuclear Survivability Design Parameters Report
MIL-HDBK-339 Base Document:1984 CUSTOM LARGE SCALE INTEGRATED CIRCUIT DEVELOPMENT & ACQUISITION FOR SPACE VEHICLES
ASTM F 616 : 1992 Standard Test Method for Measuring MOSFET Drain Leakage Current
MIL-HDBK-280 Base Document:1985 NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS
DI-NUOR-81025 Base Document:1990 NUCLEAR SURVIVABILITY MAINTENANCE/SURVEILLANCE PLAN
ASTM E 666 : 2014 : REDLINE Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
ASTM F 448 : 2011-07 TEST METHOD FOR MEASURING STEADY-STATE PRIMARY PHOTOCURRENT
MIL-STD-105 Revision E:1989 SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES
ASTM F 769 : 2000 Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)
ASTM E 820 : 1981 Practice for Determining Absolute Absorbed Dose Rates for Electron Beams (Withdrawn 1987)
ASTM F 773 : 1992 Practice for Measuring Dose Rate Response of Linear Integrated Circuits

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