MIL-HDBK-817 Base Document:1994
Current
The latest, up-to-date edition.
SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE
1. SCOPE
1.1 Background
1.2 Document application
1.3 Relationship to MIL-HDBK-814, MIL-HDBK-815, and
MIL-HDBK-816
1.4 Document objectives
2. APPLICABLE DOCUMENTS
2.1 Documents for hardness assurance programs
2.2 Military standard test methods
2.3 ASTM dosimetry standards
2.4 ASTM electrical measurement and radiation test
standards
2.5 Important documents: special attention
2.6 Device data bases
3. DEFINITIONS
3.1 Key definitions
3.2 Commonly used terms
3.3 Acronyms
4. GENERAL REQUIREMENTS
4.1 The hardness assurance program
4.2 Features of HA programs
5. DETAILED REQUIREMENTS
5.1 HA program definition
5.2 System development background: hostile threats
5.3 Life cycle survivability and hardness approach
5.4 HA program in life cycle survivability
5.5 Program management: documentation of roles
5.6 Government project manager (or SPO) HA activities
5.7 Contractor HA activities
5.8 Program development: HA through engineering and
manufacturing development (EMD)
5.9 HA during production
5.10 Other hardness assurance considerations statistical
5.11 Summary
6. REFERENCES
FIGURES
TABLES
Gives guidance in defining HA activities commensurate with the threat nuclear weapon and space radiation environment and with the concept of balanced hardening to all hostile environments. These guidelines are aimed primarily at system development agencies, project managers and their contractors.
Committee |
FSC 59GP
|
DevelopmentNote |
NOTICE 1 - Notice of Validation. (02/2015) NEW CHILD NOT 2 2021 IS NOW ADDED.
|
DocumentType |
Standard
|
Pages |
56
|
ProductNote |
NEW CHILD NOT 2 2021 IS NOW ADDED.
|
PublisherName |
US Military Specs/Standards/Handbooks
|
Status |
Current
|
MIL-STD-1546 Revision B:1992 | PARTS, MATERIALS, AND PROCESSES CONTROL PROGRAM FOR SPACE AND LAUNCH VEHICLES |
ASTM F 1191 : 1988 | Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993) |
ASTM F 632 : 1990 | Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995) |
MIL-HDBK-814 Base Document:1994 | IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES |
ASTM E 845 : 1981 | Method for Calibration of Dosimeters Against an Adiabatic Calorimeter for Use in Flash X-Ray Fields (Withdrawn 1987) |
ASTM E 665 : 1994 | Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000) |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
ASTM E 720 : 2016 : REDLINE | Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics |
ASTM E 763 : 1991 | Practice for Calculation of Absorbed Dose From Neutron Irradiation by Application of Threshold-Foil Measurement Data (Withdrawn 1997) |
ASTM F 980 : 2016 : REDLINE | Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices |
MIL-STD-480 Revision B:1988 | CONFIGURATION CONTROL - ENGINEERING CHANGES, DEVIATIONS AND WAIVERS |
ASTM F 617 : 2000 | Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006) |
ASTM E 1205 : 2009 | PRACTICE FOR USE OF A CERIC-CEROUS SULFATE DOSIMETRY SYSTEM |
MIL-STD-1547 Revision B:1992 | ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES |
DOD STD 100 : C NOTICE 6 | ENGINEERING DRAWING PRACTICES |
MIL-STD-1809 Base Document:1991 | SPACE ENVIRONMENT FOR USAF SPACE VEHICLES |
ASTM F 526 : 2016 : REDLINE | Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines |
ASTM E 265 : 2015 : REDLINE | Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32 |
ASTM F 618 : 1979 | Method for Measuring MOSFET Saturated Threshold Voltage |
MIL-HDBK-279 Base Document:1985 | TOTAL DOSE HARDNESS ASSURANCE GUIDELINE FOR SEMICONDUCTOR DEVICE & MICROCIRCUIT |
DI-NUOR-80156 Revision B:2013 | Nuclear Survivability Program Plan |
ASTM F 675 : 1991 | Test Method for Measuring Nonequilibrium Transient Photocurrents in P-N Junctions (Withdrawn 1995) |
DOD STD 1766 : A | NUCLEAR HARDNESS AND SURVIVABILITY PROGRAM REQUIREMENTS FOR ICBM WEAPON SYSTEMS |
MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
ASTM E 1026 : 2015 : REDLINE | Standard Practice for Using the Fricke Dosimetry System |
ASTM F 774 : 1982 | Guide for Analysis of Latchup Susceptibility in Bipolar Integrated Circuits (Withdrawn 1987) |
ASTM E 1027 : 1992 | Practice for Exposure of Polymeric Materials to Ionizing Radiation (Withdrawn 1996) |
ASTM E 721 : 2016 : REDLINE | Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics |
MIL-STD-414 Base Document:1957 | SAMPLING PROCEDURE AND TABLE FOR INSPECTION BY VARIABLES FOR PERCENT DEFECTIVE |
ASTM E 722 : 2014 : REDLINE | Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics |
ASTM E 668 : 2013 : REDLINE | Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices |
DI-NUOR-80926 Revision A:2013 | Nuclear Survivability Assurance Plan |
MIL-HDBK-816 Base Document:1994 | Guidelines for Developing Radiation Hardness Assurance Device Specifications |
ASTM F 570 : 1990 | Test Method for Transistor Collector-Emitter Saturation Voltage (Withdrawn 1995) |
ASTM E 1249 : 2015 : REDLINE | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
MIL-STD-339 Base Document:1987 | WIRING AND WIRING DEVICES FOR COMBAT AND TACTICAL VEHICLES, SELECTION AND INSTALLATION OF |
ASTM F 1032 : 1991 | Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994) |
DI-NUOR-80928 Revision A:2013 | Nuclear Survivability Test Plan |
ASTM E 1250 : 2015 : REDLINE | Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices |
MIL-HDBK-780 Revision D:2004 | STANDARD MICROCIRCUIT DRAWINGS |
ASTM F 1096 : 1987 | Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992) |
DI-ENVR-80266 Revision A:2016 | NUCLEAR HARDNESS AND SURVIVABILITY (NH&S) DESIGN ANALYSIS REPORT |
MIL-HDBK-815 Base Document:1994 | DOSE-RATE HARDNESS ASSURANCE GUIDELINES |
ASTM F 1467 : 2011-10 | GUIDE FOR USE OF AN X-RAY TESTER ([APPROXIMATE] 10 KEV PHOTONS) IN IONIZING RADIATION EFFECTS TESTING OF SEMICONDUCTOR DEVICES AND MICROCIRCUITS |
DI-NUOR-80927 Revision A:2013 | Nuclear Survivability Design Parameters Report |
MIL-HDBK-339 Base Document:1984 | CUSTOM LARGE SCALE INTEGRATED CIRCUIT DEVELOPMENT & ACQUISITION FOR SPACE VEHICLES |
ASTM F 616 : 1992 | Standard Test Method for Measuring MOSFET Drain Leakage Current |
MIL-HDBK-280 Base Document:1985 | NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS |
DI-NUOR-81025 Base Document:1990 | NUCLEAR SURVIVABILITY MAINTENANCE/SURVEILLANCE PLAN |
ASTM E 666 : 2014 : REDLINE | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
ASTM F 448 : 2011-07 | TEST METHOD FOR MEASURING STEADY-STATE PRIMARY PHOTOCURRENT |
MIL-STD-105 Revision E:1989 | SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
ASTM F 769 : 2000 | Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006) |
ASTM E 820 : 1981 | Practice for Determining Absolute Absorbed Dose Rates for Electron Beams (Withdrawn 1987) |
ASTM F 773 : 1992 | Practice for Measuring Dose Rate Response of Linear Integrated Circuits |
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