• MIL-HDBK-279 Base Document:1985

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    TOTAL DOSE HARDNESS ASSURANCE GUIDELINE FOR SEMICONDUCTOR DEVICE & MICROCIRCUIT

    Available format(s):  PDF

    Superseded date:  20-12-2001

    Language(s): 

    Published date: 

    Publisher:  US Military Specs/Standards/Handbooks

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    Abstract - (Show below) - (Hide below)

    Outlines effects of total-dose radiation on electronic piece parts.

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    Development Note NOTICE 1 - Notice of Cancellation/Superseded by MIL HDBK 814. (09/2004)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-STD-989 Base Document:1991 CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES
    MIL-HDBK-817 Base Document:1994 SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE
    MIL-HDBK-816 Base Document:1994 Guidelines for Developing Radiation Hardness Assurance Device Specifications
    MIL-HDBK-815 Base Document:1994 DOSE-RATE HARDNESS ASSURANCE GUIDELINES
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