MIL-STD-750-1 Revision A:2015
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999
23-06-2020
English
11-12-2015
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FOREWORD
SUMMARY OF REVISION A MODIFICATIONS
1. SCOPE
2. APPLICABLE DOCUMENTS
3. DEFINITIONS
4. GENERAL REQUIREMENTS
5. DETAILED REQUIREMENTS
6. NOTES
CONCLUDING MATERIAL
Determines uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Standard
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| Pages |
177
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
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| SupersededBy |
Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term \"devices\" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
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