MIL-STD-883-5 Base Document:2019
Current
Current
The latest, up-to-date edition.
Test Procedures for Microcircuits Part 5: Test Methods 5000-5999
Available format(s)
PDF
Language(s)
English
Published date
16-09-2019
Publisher
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Part 5 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Test Method
|
| Pages |
0
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| ProductNote |
THIS STANDARD IS ALSO REFER TO: SAE AMS-STD 595/15102, SAE AMS STD 595/25102, ANSI Z 5403, JEDEC STANDARD12, JEDEC STANDARD 12-1, JEDEC STANDARD 12-2, JEDEC STANDARD 12-3
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| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Standards | Relationship |
| DSCC89844H:2023 | Identical |
| DSCC 09220C:2022 | MICROCIRCUIT, LINEAR, DIFFERENTIAL ANALOG-TO-DIGITAL CONVERTER DRIVER, LOW DISTORTION, MONOLITHIC SILICON |
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