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NASA MSFC SPEC 1198 : 1960

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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SCREENING REQUIREMENTS FOR NONSTANDARD ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS

Superseded date

23-07-2013

Superseded by

NASA MSFC SPEC 1198:1987

Published date

01-01-1960

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1 SCOPE
  1.1 Scope
  1.2 Limitations
  1.3 Use
  1.4 Objective
  1.5 Application
2 Applicable Documents
3 General Requirements
  3.1 Screening Requirements
      3.1.1 Screening
      3.1.2 Test Procedures
      3.1.3 Test and Data Submission
      3.1.4 Detail Test Requirements
  3.2 Request for Deviations
  3.3 Screening Facility
  3.4 Screening Facility's Responsibility
4 Detail Requirements
  4.1 Minimum Screening Requirements
5 N/A
6 Notes
  6.1 Definitions
      6.1.1 Screening
      6.1.2 Inspection
      6.1.3 Examination
      6.1.4 Testing
      6.1.5 Screening inspection
      6.1.6 Part
      6.1.7 NASA Standard Parts
      6.1.8 Nonstandard Parts
      6.1.9 Nondestructive Tests
      6.1.10 Commercial Laboratory
  6.2 Information Concerning this Document
Appendix A - Minimum Screening Requirements for Capacitors
Appendix B - Minimum Screening Requirements for Circuit Breakers
Appendix C - Minimum Screening Requirements for Crystals,
             Frequency Standard
Appendix D - Minimum Screening Requirements for Electromagnetic
             Parts (Transformers, Inductors, Filters and
             Rotating Parts)
Appendix E - Minimum Screening Requirements for Fuses
Appendix F - Minimum Screening Requirements for Meters
Appendix G - Minimum Screening Requirements for Microcircuits
Appendix H - Minimum Screening Requirements for Relays
Appendix I - Minimum Screening Requirements for Resistors
Appendix J - Minimum Screening Requirements for Discrete
             Semiconductor Devices
Appendix K - Minimum Screening Requirements for Switches
Appendix L - Minimum Screening Requirements for Transducers
Appendix X - Nonstandard Parts Selection and Application
             Criteria

Establishes minimum screening requirements for nonstandard electrical and electronic parts, as specified in the applicable appendices that are to be used in high-reliability electronic equipment for space applications.

DocumentType
Standard
PublisherName
National Aeronautics and Space Administration
Status
Superseded
SupersededBy

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NASA MSFC SPEC 250 : 1963 PROTECTIVE FINISHES FOR SPACE VEHICLE STRUCTURES AND ASSOCIATED FLIGHT EQUIPMENT GENERAL SPECIFICATION FOR
MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-STD-975 Revision M:1994 NASA STANDARD (EEE) PARTS LIST
MIL T 21038 : D TRANSFORMERS, PULSE, LOW POWER, GENERAL SPECIFICATION FOR
MIL-STD-1686 Revision C:1995 ELECTROSTATIC DISCHARGE CONTROL PROGRAM FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES)
MIL-M-38510 Revision J:1991 MICROCIRCUITS, SPECIFICATION FOR
MIL T 27 : E TRANSFORMERS AND INDUCTORS (AUDIO POWER AND HIGH POWER PULSE) GENERAL SPECIFICATION FOR
MIL C 18388 : C COIL, TUBE DEFLECTION, AND COILS, TUBE FOCUSING
MIL F 15733 : G FILTERS & CAPACITORS, RADIO FREQUENCY INTERFERENCE
MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
MIL-STD-981 Revision C:2010 DESIGN, MANUFACTURING AND QUALITY STANDARDS FOR CUSTOM ELECTROMAGNETIC DEVICES FOR SPACE APPLICATIONS
MIL-T-55631 Base Document:1972 TRANSFORMER, INTERMEDIATE FREQUENCY, RADIO FREQUENCY, AND DISCRIMINATOR, GENERAL SPECIFICATION FOR

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