NBN EN 15991 : 2015
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The latest, up-to-date edition.
TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV)
Published date
12-01-2013
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Describes a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 15991:2015 | Identical |
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