NBN EN 60749-1 : 2004
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL
Published date
12-01-2013
Publisher
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INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
| DevelopmentNote |
Supersedes NBN EN 60749. (04/2004)
|
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-1:2003-12 | Identical |
| EN 60749-1:2003 | Identical |
| UNE-EN 60749-1:2004 | Identical |
| BS EN 60749-1:2003 | Identical |
| I.S. EN 60749-1:2003 | Identical |
Summarise
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