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NBN EN 60749-13 : 2003

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Published date

12-01-2013

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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.

DocumentType
Standard
PublisherName
Belgian Standards
Status
Current

Standards Relationship
DIN EN 60749-13:2003-04 Identical
BS EN 60749-13:2002 Identical
I.S. EN 60749-13:2002 Identical
UNE-EN 60749-13:2003 Identical
EN 60749-13:2002 Identical

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