NBN EN 60749-13 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
12-01-2013
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.
DocumentType |
Standard
|
PublisherName |
Belgian Standards
|
Status |
Current
|
Standards | Relationship |
DIN EN 60749-13:2003-04 | Identical |
BS EN 60749-13:2002 | Identical |
I.S. EN 60749-13:2002 | Identical |
UNE-EN 60749-13:2003 | Identical |
EN 60749-13:2002 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.