NBN EN 60749-19 : 2004 AMD 1 2010
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 19: DIE SHEAR STRENGTH
Published date
12-01-2013
Publisher
| DevelopmentNote |
Supersedes NBN EN 60749. (04/2004)
|
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
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