NBN EN 60749-20 : 2010
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 20: RESISTANCE OF PLASTIC-ENCAPSULATED SMDS TO THE COMBINED EFFECT OF MOISTURE AND SOLDERING HEAT
12-01-2013
INTRODUCTION
1 Scope and object
2 Normative references
3 General description
4 Test apparatus and materials
5 Procedure
6 Information to be given in the relevant specification
Annex A (normative) Methods of inspection by acoustic
tomography
Annex B (informative) Details and descriptions of test method
on resistance of plastic-encapsulated SMDs to the
combined effect of moisture and soldering heat
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Applies to semiconductor devices (discrete devices and integrated circuits). It provides a means of assessing the resistance to soldering heat of plastic-encapsulated surface mount devices (SMDs).
| DevelopmentNote |
Supersedes NBN EN 60749. (04/2004)
|
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-20:2010-04 | Identical |
| BS EN 60749-20:2009 | Identical |
| UNE-EN 60749-20:2004 | Identical |
| I.S. EN 60749-20:2009 | Identical |
| EN 60749-20:2009 | Identical |
| NF EN 60749-20 : 2010 | Identical |
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