NBN EN 60749-6 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE
12-01-2013
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-6:2016-09 (Draft) | Identical |
| I.S. EN 60749-6:2017 | Identical |
| BS EN 60749-6:2017 | Identical |
| NF EN 60749-6 : 2002 | Identical |
| EN 60749-6:2017 | Identical |
| UNE-EN 60749-6:2003 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.