NBN EN 60749-6 : 2003
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE
Published date
12-01-2013
Publisher
Sorry this product is not available in your region.
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-6:2016-09 (Draft) | Identical |
| UNE-EN 60749-6:2003 | Identical |
| I.S. EN 60749-6:2017 | Identical |
| BS EN 60749-6:2017 | Identical |
| NF EN 60749-6 : 2002 | Identical |
| EN 60749-6:2017 | Identical |
Summarise
Sorry this product is not available in your region.