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NF EN 60749-6 : 2002

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE

Withdrawn date

07-10-2021

Published date

12-01-2013

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
          publications with their corresponding European
          publications

Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.

DevelopmentNote
Indice de classement: C96-022-6. (03/2003) Supersedes NF EN 60749. (06/2007)
DocumentType
Standard
PublisherName
Association Francaise de Normalisation
Status
Withdrawn
SupersededBy

Standards Relationship
I.S. EN 60749-6:2017 Identical
UNE-EN 60749-6:2003 Identical
NBN EN 60749-6 : 2003 Identical
IEC 60749-6:2017 Identical
BS EN 60749-6:2002 Identical
EN 60749-6:2017 Identical
DIN EN 60749-6:2016-09 (Draft) Identical
BS EN 60749-6:2017 Identical

IEC 60068-2-48:1982 Environmental testing - Part 2: Tests. Guidance on the application of the tests of IEC 68 to simulate the effects of storage
NF EN 60068 2-48 : 2000 ENVIRONMENTAL TESTING - PART 2: TESTS - GUIDANCE ON THE APPLICATION OF THE TEST OF IEC 60068 TO SIMULATE THE EFFECTS OF STORAGE

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