NEN EN 100012 : 1995
Current
The latest, up-to-date edition.
BASIC SPECIFICATION - X-RAY INSPECTION OF ELECTRONIC COMPONENTS
12-01-2013
1 Definitions
1.1 Radiography
1.2 Radioscopy
1.3 Searchray Camera
2 Scope
3 Equipment and materials
4 Procedure
4.1 General
4.2 Mounting of components
4.3 Indicators for the spatial resolution
4.4 Indicators for the image contrast
4.5 Positioning of components
4.6 Radiation direction
4.7 Marking of documents
4.8 Information concerning radiographic
4.9 Information concerning radioscopy
4.10 Operating personnel
5 Interpretation of results
6 Reports and records
6.1 Reports of inspection
6.2 Presentation of radiographs
6.3 Retention of reports and inspection records
7 Examination and acceptance criteria
Describes the equipment and procedures to be used for the inspection of electronic components by means of radiography and radioscopy.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 100012:1995-09 | Identical |
| BS EN 100012:1996 | Identical |
| IEC 60147-2M:1980 | Identical |
| EN 100012:1995 | Identical |
| IEC 60147-2G:1975 | Identical |
| IEC 60147-2B:1970 | Identical |
| EN 100012 : 1995 | Identical |
| I.S. EN 100012:1995 | Identical |
| IEC 60147-2C:1970 | Identical |
| IEC 60147-2K:1978 | Identical |
| IEC 60147-2:1963 | Identical |
| IEC 60147-2F:1974 | Identical |
| IEC 60147-2J:1978 | Identical |
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