NEN EN 12668-2 : 2010

Foreword
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviations
4 General requirements for compliance
5 Manufacturer's technical specification for probes
6 Test equipment
   6.1 Electronic equipment
   6.2 Test blocks and other equipment
7 Performance requirements for probes
   7.1 Physical aspects
   7.2 Radio frequency pulse shape
   7.3 Pulse spectrum and bandwidth
   7.4 Relative pulse-echo sensitivity
   7.5 Distance-amplitude curve
   7.6 Electrical impedance or static capacitance
   7.7 Beam parameters for immersion probes
   7.8 Beam parameters for contact, straight-beam,
        single-transducer probes
   7.9 Beam parameters for contact, shear wave,
        angle-beam, single-transducer probes
   7.10 Beam parameters for contact, straight-beam,
        dual-transducer probes
   7.11 Beam parameters for contact, shear wave,
        angle-beam, dual-transducer probes
Annex A (normative) Calculation of nearfield length of
                      non-focusing probes
Annex B (informative) Calibration block for angle-beam
                      probes

Defines probes used for ultrasonic non-destructive examination in the following categories with centre frequencies in the range 0,5 MHz to 15 MHz, focusing and without focusing means: a) single or dual transducer contact probes generating compressional or shear waves; b) single transducer immersion probes.