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NEN EN 190100 : 2005

Current

Current

The latest, up-to-date edition.

SECTIONAL SPECIFICATION - DIGITAL MONOLITHIC INTEGRATED CIRCUITS

Published date

12-01-2013

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Foreword
Preface
1 Scope
2 General
2.1 Related documents
2.2 Preferred voltages for digital monolithic
        integrated circuits
2.3 Symbols and terminology
3 Quality assessment procedures
3.1 Structurally similar circuits
3.2 Certified test records
4 Test and measurement procedures
4.1 Electrical measurement procedures
4.1.1 Verification of the function
4.1.2 Measurement of static characteristics
4.1.3 Measurement of dynamic characteristics
4.1.4 Output short-circuit current
4.1.5 Breakdown voltage
4.1.6 Power supply current
4.1.7 Capacitance
4.1.8 Leakage current
4.1.9 Transient energy rating
4.1.10 Input clamping voltage
4.2 Endurance tests
4.2.1 General
4.2.2 Test conditions
5 Common blank detail specification for digital
        monolithic integrated circuits
5.1 Introduction
5.2 Front page
5.3 Identification of the component and
        supplementary information
5.4 Inspection requirements
5.4.1 Explanation of assessment quality levels, P, Y
        and L
5.4.2 Key of abbreviations
        Group A inspection
        Group B inspection
        Group C inspection
        Group D inspection
5.5 Requirements for sub-groups A3, A4 and A5
5.5.1 Requirements for TTL combinatorial circuits
5.5.2 Requirements for C.MOS circuits

Gives ratings, characteristics and inspection requirements to be included as mandatory requirements in accordance with BS CECC 90100 in any detail specification for these devices.

DevelopmentNote
To be read in conjunction with CECC 90000. (08/2005)
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
DIN EN 190100:1995-02 Identical
BS EN 190100:1993 Identical
EN 190100:1993 Identical

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