NEN EN 190100 : 2005
Current
The latest, up-to-date edition.
SECTIONAL SPECIFICATION - DIGITAL MONOLITHIC INTEGRATED CIRCUITS
12-01-2013
Foreword
Preface
1 Scope
2 General
2.1 Related documents
2.2 Preferred voltages for digital monolithic
integrated circuits
2.3 Symbols and terminology
3 Quality assessment procedures
3.1 Structurally similar circuits
3.2 Certified test records
4 Test and measurement procedures
4.1 Electrical measurement procedures
4.1.1 Verification of the function
4.1.2 Measurement of static characteristics
4.1.3 Measurement of dynamic characteristics
4.1.4 Output short-circuit current
4.1.5 Breakdown voltage
4.1.6 Power supply current
4.1.7 Capacitance
4.1.8 Leakage current
4.1.9 Transient energy rating
4.1.10 Input clamping voltage
4.2 Endurance tests
4.2.1 General
4.2.2 Test conditions
5 Common blank detail specification for digital
monolithic integrated circuits
5.1 Introduction
5.2 Front page
5.3 Identification of the component and
supplementary information
5.4 Inspection requirements
5.4.1 Explanation of assessment quality levels, P, Y
and L
5.4.2 Key of abbreviations
Group A inspection
Group B inspection
Group C inspection
Group D inspection
5.5 Requirements for sub-groups A3, A4 and A5
5.5.1 Requirements for TTL combinatorial circuits
5.5.2 Requirements for C.MOS circuits
Gives ratings, characteristics and inspection requirements to be included as mandatory requirements in accordance with BS CECC 90100 in any detail specification for these devices.
DevelopmentNote |
To be read in conjunction with CECC 90000. (08/2005)
|
DocumentType |
Standard
|
PublisherName |
Netherlands Standards
|
Status |
Current
|
Standards | Relationship |
DIN EN 190100:1995-02 | Identical |
BS EN 190100:1993 | Identical |
EN 190100:1993 | Identical |
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