NEN EN 190100 : 2005

Foreword
Preface
1 Scope
2 General
2.1 Related documents
2.2 Preferred voltages for digital monolithic
        integrated circuits
2.3 Symbols and terminology
3 Quality assessment procedures
3.1 Structurally similar circuits
3.2 Certified test records
4 Test and measurement procedures
4.1 Electrical measurement procedures
4.1.1 Verification of the function
4.1.2 Measurement of static characteristics
4.1.3 Measurement of dynamic characteristics
4.1.4 Output short-circuit current
4.1.5 Breakdown voltage
4.1.6 Power supply current
4.1.7 Capacitance
4.1.8 Leakage current
4.1.9 Transient energy rating
4.1.10 Input clamping voltage
4.2 Endurance tests
4.2.1 General
4.2.2 Test conditions
5 Common blank detail specification for digital
        monolithic integrated circuits
5.1 Introduction
5.2 Front page
5.3 Identification of the component and
        supplementary information
5.4 Inspection requirements
5.4.1 Explanation of assessment quality levels, P, Y
        and L
5.4.2 Key of abbreviations
        Group A inspection
        Group B inspection
        Group C inspection
        Group D inspection
5.5 Requirements for sub-groups A3, A4 and A5
5.5.1 Requirements for TTL combinatorial circuits
5.5.2 Requirements for C.MOS circuits