NEN EN IEC 60191-6-3 : 2001
Current
Current
The latest, up-to-date edition.
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - PART 6-3: GENERAL RULES FOR THE PREPARATION OF OUTLINE DRAWINGS OF SURFACE MOUNTED SEMICONDUCTOR DEVICE PACKAGES - MEASURING METHODS FOR PACKAGE DIMENSIONS OF QUAD FLAT PACKS (QFP)
Published date
12-01-2013
Publisher
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Stipulates a method for quad flat packs (QFP) measuring dimensions, which are classified into Form E.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 60191-6-3:2000 | Identical |
| IEC 60191-6-3:2000 | Identical |
Summarise
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