NEN EN IEC 60749-17 : 2003
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION
20-05-2019
12-01-2013
Defines the susceptibility of semiconductor devices to degradation in the neutron environment. Applies to integrated circuits and discrete semiconductor devices. Beneficial for military and space-related applications as it is a destructive test.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| IEC 60749-17:2003 | Identical |
| EN 60749-17:2003 | Identical |
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