NEN EN IEC 60749-19 : 2003 AMD 1 2010
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 19: DIE SHEAR STRENGTH
Published date
12-01-2013
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Determines the integrity of materials and procedures used to attach semiconductor die to packaging headers or other substrates generally only applicable to cavity packages or as a process monitor.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-19:2003/A1:2010 | Identical |
| IEC 60749-19:2003+AMD1:2010 CSV | Identical |
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