NEN EN IEC 60749-24 : 2004
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
Published date
12-01-2013
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Specifies the unbiased highly accelerated stress testing (HAST), which is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-24:2004 | Identical |
| IEC 60749-24:2004 | Identical |
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