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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
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Published date: 12-01-2013
Publisher: Netherlands Standards
Specifies the unbiased highly accelerated stress testing (HAST), which is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
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