NEN EN IEC 60749-32 : 2003 AMD 1 2010
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
Published date
12-01-2013
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Applies to semiconductor devices (discrete devices and integrated circuits). The test determines whether the device ignites due to external heating.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-32:2002+AMD1:2010 CSV | Identical |
| EN 60749-32:2003/A1:2010 | Identical |
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