IEC 60749-32:2002+AMD1:2010 CSV
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Hardcopy , PDF
English, English - French
29-11-2010
FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test Procedure
IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC 60749. (03/2008) Stability Date: 2015. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60749-32 : 2003 AMD 1 2011 | Identical |
| NEN EN IEC 60749-32 : 2003 AMD 1 2010 | Identical |
| I.S. EN 60749-32:2003 | Identical |
| PN EN 60749-32 : 2005 AMD 1 2010 | Identical |
| BS EN 60749-32 : 2003 | Identical |
| DIN EN 60749-32:2011-01 | Identical |
| UNE-EN 60749-32:2004 | Identical |
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