NEN EN IEC 60749-37 : 2008

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER

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Published date: 12-01-2013

Publisher: Netherlands Standards

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Defines a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure.

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Development Note	Supersedes NEN NPR IEC/PAS 62050. (05/2008)
Document Type	Standard
ISBN
Pages
Published
Publisher	Netherlands Standards
Status	Current
Supersedes	NEN NPR IEC/PAS 62050 : 2004

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Equivalent Standard(s)	Relationship
EN 60749-37:2008	Identical
IEC 60749-37:2008	Identical

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