• Shopping Cart
    There are no items in your cart

NEN EN IEC 60749-44 : 2016

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES

Published date

09-01-2017

Sorry this product is not available in your region.

Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
EN 60749-44:2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.