NEN EN IEC 61967-2 : 2005
Current
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
Published date
12-01-2013
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Defines a method for measuring the electromagnetic radiation from an integrated circuit (IC).
DocumentType |
Standard
|
PublisherName |
Netherlands Standards
|
Status |
Current
|
Standards | Relationship |
EN 61967-2:2005 | Identical |
IEC 61967-2:2005 | Identical |
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