NEN EN IEC 62417 : 2010
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MOBILE ION TESTS FOR METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTORS (MOSFETS)
Published date
12-01-2013
Publisher
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Defines a wafer level test procedure to determine the amount of positive mobile charge in oxide layers in metal-oxide semiconductor field effect transistors.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62417:2010 | Identical |
| EN 62417:2010 | Identical |
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