NEN IEC 60748-11 : 2000 AMD 2 2000
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 11: SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
Published date
12-01-2013
Publisher
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Defines inspection and sampling requirements, screening sequences, test and measurement methods in order to assess integrated circuits.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60748-11:1990 | Identical |
Summarise
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