NEN IEC 63003 : 2016
Current
Current
The latest, up-to-date edition.
STANDARD FOR THE COMMON TEST INTERFACE PIN MAP CONFIGURATION FOR HIGH-DENSITY, SINGLE-TIER ELECTRONICS TEST REQUIREMENTS UTILIZING IEEE STD 1505[TM]
Published date
11-04-2016
Publisher
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Pertains to military and aerospace automatic test equipment (ATE) testing applications.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 63003:2015 | Identical |
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