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  • IEC 63003:2015

    Current The latest, up-to-date edition.

    Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English

    Published date:  14-12-2015

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

    General Product Information - (Show below) - (Hide below)

    Development Note Also numbered as IEEE 1505.1. (12/2015)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-DTL-55302 Revision G:2009 CONNECTORS, PRINTED CIRCUIT SUBASSEMBLY AND ACCESSORIES
    IEEE 260.3-1993 American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology
    IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
    IEEE 945-1984 IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology
    IEEE/ASTM SI_10-2010 American National Standard for Metric Practice
    MIL C 83733 : C CONNECTOR, ELECTRICAL, MINIATURE, RECTANGULAR TYPE, RACK TO PANEL, ENVIRONMENT RESISTING, 200 DEGREES C TOTAL CONTINUOUS OPERATING TEMPERATURE, GENERAL SPECIFICATION FOR
    IEEE 315 : 1975 GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS)
    MIL-PRF-28800 Revision F:1996 TEST EQUIPMENT FOR USE WITH ELECTRICAL AND ELECTRONIC EQUIPMENT, GENERAL SPECIFICATION FOR
    MIL-HDBK-217 Revision F:1991 RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT
    IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture
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