NEN ISO 16700 : 2016
Current
Current
The latest, up-to-date edition.
MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION
Published date
12-01-2013
Publisher
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Defines a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 16700:2016 | Identical |
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