NEN ISO 24173 : 2009
Current
Current
The latest, up-to-date edition.
MICROBEAM ANALYSIS - GUIDELINES FOR ORIENTATION MEASUREMENT USING ELECTRON BACKSCATTER DIFFRACTION
Published date
12-01-2013
Publisher
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Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It also addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 24173:2009 | Identical |
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