NEN ISO 24173 : 2009
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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MICROBEAM ANALYSIS - GUIDELINES FOR ORIENTATION MEASUREMENT USING ELECTRON BACKSCATTER DIFFRACTION
Published date
12-01-2013
Publisher
Superseded date
13-11-2025
Superseded by
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Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It also addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| ISO 24173:2009 | Identical |
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