NEN ISO 6342 : 2003
Current
Current
The latest, up-to-date edition.
MICROGRAPHICS - APERTURE CARDS - METHOD OF MEASURING THICKNESS OF BUILDUP AREA
Published date
12-01-2013
Publisher
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Defines a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| ISO 6342:2003 | Identical |
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