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CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 6-2: DYNAMIC STRESS TESTS - TEST 6B: BUMP
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Published date: 12-01-2013
Publisher: Association Francaise de Normalisation
Foreword1 General2 Preparation of the specimen3 Test method4 Measurements5 Details to be specifiedAnnex ZA (normative) Normative references to international publications with their corresponding European publications
Assess the ability of components to withstand specified severities of bump.
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