• BS EN 60512-6-2:2002

    Current The latest, up-to-date edition.

    Connectors for electronic equipment. Tests and measurements. Dynamic stress tests Test 6b. Bump

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  05-06-2002

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    1 General
    2 Preparation of the specimen
    3 Test method
    4 Measurements
    5 Details to be specified
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Assess the ability of components to withstand specified severities of bump.

    Scope - (Show below) - (Hide below)

    Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/48
    Development Note Supersedes 00/203601 DC (06/2002)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60512-7:1993 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
    IEC 60512-2-5:2003 Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance
    EN 60512-1:2001 Connectors for electronic equipment - Tests and measurements - Part 1: General
    IEC 60512-1-1:2002 Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
    IEC 60512-2-1:2002 Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method
    EN 60068-2-29:1993 Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    EN 60512-2-1:2002 Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method
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