NF EN 60749-1 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL
12-01-2013
AVANT-PROPOS
INTRODUCTION
1 Domaine d'application
2 Références normatives
3 Termes, définitions et symboles littéraux
4 Conditions atmosphériques normales
5 Mesures électriques
6 Utilisation de dispositifs défectueux électriquement
Annexe ZA (normative) Références normatives â d'autres
publications internationales avec les
publications européennes correspondantes
Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
| DevelopmentNote |
Indice de classement: C96-022-1. PR NF EN 60749-1 August 2001 (07/2001) Supersedes NF EN 60749. (06/2007)
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| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-1:2003-12 | Identical |
| IEC 60749-1:2002 | Identical |
| EN 60749-1:2003 | Identical |
| UNE-EN 60749-1:2004 | Identical |
| BS EN 60749-1:2003 | Identical |
| I.S. EN 60749-1:2003 | Identical |
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