NF EN 60749-13 : 2002
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
12-01-2013
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.
| DevelopmentNote |
Indice de classement: C96-022-13PR. (03/2003) Supersedes NF EN 60749. (06/2007) PR NF EN 60749-13 January 2018. (01/2018)
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| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-13:2003-04 | Identical |
| BS EN 60749-13:2002 | Identical |
| I.S. EN 60749-13:2002 | Identical |
| UNE-EN 60749-13:2003 | Identical |
| EN 60749-13:2002 | Identical |
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