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  • NF EN 60749-13 : 2002

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

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    Published date:  12-01-2013

    Publisher:  Association Francaise de Normalisation

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    1 Scope
    2 Normative references
    3 Test apparatus
    4 Procedure
    5 Summary
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.

    General Product Information - (Show below) - (Hide below)

    Development Note Indice de classement: C96-022-13PR. (03/2003) Supersedes NF EN 60749. (06/2007) PR NF EN 60749-13 January 2018. (01/2018)
    Document Type Standard
    Publisher Association Francaise de Normalisation
    Status Current
    View more information

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