NF EN 60749-17 : 2003
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The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION
Published date
12-01-2013
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Foreword
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary
Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
| DevelopmentNote |
PR NF EN 60749-17 February 2002. Indice de Classement: C96-022-17. (01/2002)
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| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-17:2003-09 | Identical |
| IEC 60749-17:2003 | Identical |
| BS EN 60749-17:2003 | Identical |
| I.S. EN 60749-17:2003 | Identical |
| UNE-EN 60749-17:2003 | Identical |
| EN 60749-17:2003 | Identical |
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