• NF EN 60749-24 : 2005

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST

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    Published date:  12-01-2013

    Publisher:  Association Francaise de Normalisation

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    Table of Contents - (Show below) - (Hide below)

    AVANT-PROPOS
    1 Domaine d'application et objet
    2 Références normatives
    3 Appareillage
      3.1 Enregistrements
      3.2 Dispositifs sous contrainte
      3.3 Contamination ionique
      3.4 Eau distillée ou dé ionisée
    4 Exigences générales
    5 Conditions d'essai
    6 Procédure
      6.1 Constitution des conditions d'essais
      6.2 Retour aux conditions initiales
      6.3 Horloge d'Essai
      6.4 Essais électriques
      6.5 Manipulation
    7 Critères de défaillance
    8 Sécurité
    9 Résumé

    Abstract - (Show below) - (Hide below)

    Specifies temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

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    Development Note Indice de classement: C96-022-24 (12/2005)
    Document Type Standard
    Publisher Association Francaise de Normalisation
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    NF EN 60749-30 : 2005 AMD 1 2011 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
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