• NF EN 60749-32 : 2003 AMD 1 2011

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

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    Published date:  12-01-2013

    Publisher:  Association Francaise de Normalisation

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    Foreword
    INTRODUCTION
    1 Scope and object
    2 Normative references
    3 Test procedure
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.

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    Development Note Indice de classement: C96-022-32. (12/2003) Supersedes NF EN 60749. (06/2007)
    Document Type Standard
    Publisher Association Francaise de Normalisation
    Status Current
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