• There are no items in your cart

NF EN 60749-4:2017

Current

Current

The latest, up-to-date edition.

Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Available format(s)

Hardcopy

Language(s)

English - French

Published date

01-06-2017

€110.96
Excluding VAT

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Committee
TC 47
DocumentType
Test Method
Pages
14
PublisherName
Association Francaise de Normalisation
Status
Current
Supersedes

Standards Relationship
EN 60749-4:2017 Identical

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.