NF EN 60749-4:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Available format(s)
Hardcopy
Language(s)
English - French
Published date
01-06-2017
Publisher
This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
Committee |
TC 47
|
DocumentType |
Test Method
|
Pages |
14
|
PublisherName |
Association Francaise de Normalisation
|
Status |
Current
|
Supersedes |
Standards | Relationship |
EN 60749-4:2017 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.