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NF EN 60749-43 : 2017

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS

Published date

24-01-2017

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DevelopmentNote
Indice de classement: C96-022-43. PR NF EN 60749-43 November 2016. (01/2017)
DocumentType
Standard
PublisherName
Association Francaise de Normalisation
Status
Current

Standards Relationship
IEC 60749-43:2017 Identical
EN 60749-43:2017 Identical

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