NF EN 60749-6:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods – Part 6: Storage at high temperature
Available format(s)
Hardcopy
Language(s)
English - French
Published date
01-06-2017
Publisher
The purpose of this part of IEC 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
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