NF EN 60749-6:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods – Part 6: Storage at high temperature
Available format(s)
Hardcopy
Language(s)
English - French
Published date
01-06-2017
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.The purpose of this part of IEC 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| Pages |
11
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-6:2017 | Identical |
| EN 60749-6:2017 | Identical |
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