NF EN IEC 60749-30:2020
Current
Current
The latest, up-to-date edition.
Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Available format(s)
Hardcopy
Language(s)
French, English
Published date
01-09-2020
Publisher
DocumentType |
Test Method
|
Pages |
19
|
PublisherName |
Association Francaise de Normalisation
|
Status |
Current
|
Supersedes |
Standards | Relationship |
IEC 60749-30:2020 | Identical |
EN IEC 60749-30:2020 | Identical |
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