NF EN IEC 60749-30:2020
Current
Current
The latest, up-to-date edition.
Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Published date
01-09-2020
Publisher
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| DocumentType |
Test Method
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-30:2020 | Identical |
| EN IEC 60749-30:2020 | Identical |
Summarise
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